Electron Microscopy


Electron Microscopy.  photo
Scanning Electron Microscopy (SEM) is a powerful and  indispensable tool for failure analysis, troubleshooting and process verification.

The microscopy is ideal for high magnification (well above the magnification limit of light microscopy of 1000-1500x) imaging

Some examples of the capabilities of  this technique can be found on the Case Histories page.


   416-899-1882
   647-495-8727
   info@sentec.ca

SENTEC Testing Laboratory Inc.
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